OREANDA-NEWS. September 18, 2012. Yokogawa Electric Corporation announces that it will release a multi-DUT* test system for high-brightness light-emitting diodes (LEDs) on October 1. Jointly developed with SUN-S Co., Ltd., this system can simultaneously measure the optical and electrical characteristics of four LEDs, shortening the test time by 60% compared to conventional DUT test systems that can test only one device at a time. This will dramatically reduce test costs.

This system will be exhibited at the LED Japan Conference & Expo/Strategies in Light, which will be held at the Pacifico Yokohama convention center from September 25 to 27.
* DUT: Device under test
Development Background

The market for long-life, low power consumption LED lights is rapidly expanding due to increasing awareness of the need for energy saving. As many companies enter the market, prices are falling and thus LED chip manufacturers are working hard to cut costs and improve test efficiency to enhance competitiveness. They need to improve throughput by increasing the number of LEDs that can be tested at one time, a task that is difficult due to the probing scheme requirements of LED chips.

This multi-DUT test system for high-brightness LEDs has been made possible by the combination of Yokogawa’s high-speed spectrometry measuring technology and SUN-S’s expertise in semiconductor manufacturing equipment.
Configuration of the Test System

Yokogawa has developed the SP1000 spectrometer for measuring optical characteristics and the FS-18V/50V source measurement measure unit that measures electrical characteristics, supplies a drive current, and outputs test signals, while SUN-S has developed a prober that comes into contact with LED chips and feeds them electric current through contact needles. This system includes automatic test control software and a PC that serves as the human machine interface (HMI) for test operation and engineering. This is a turnkey test system solution for high-brightness LEDs.